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References: [ +subject:/^(?:^\s*(re|sv|fwd|fw)[\[\]\d]*[:>-]+\s*)*\[Amps\]\s+testing\s+RF\s+power\s+MOSFET\s+devices\s*$/: 2 ]

Total 2 documents matching your query.

1. [Amps] testing RF power MOSFET devices (score: 1)
Author: Dan Sawyer <dansawyer@earthlink.net>
Date: Sun, 22 Feb 2009 19:59:28 -0800
This is a general question regarding 'testing' RF power MOSFETs 1. There appears to be a difference between the MRF150 and the ST equivalent based on the 'simple' test of placing the negative lead of
/archives//html/Amps/2009-02/msg00654.html (7,547 bytes)

2. Re: [Amps] testing RF power MOSFET devices (score: 1)
Author: "Alex Eban" <alexeban@gmail.com>
Date: Mon, 23 Feb 2009 10:29:35 +0200
1 and 2 are correlated: the 2Megs. Reading indicates that there is a leakage path from gate to ground. The charge impressed on the gate leaks through it and causes a gradual turn off of the transisto
/archives//html/Amps/2009-02/msg00656.html (8,842 bytes)


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