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References: [ +subject:/^(?:^\s*(re|sv|fwd|fw)[\[\]\d]*[:>-]+\s*)*\[TowerTalk\]\s+Hi\s+Pot\s+testing\s+Effects\.\.\s*$/: 2 ]

Total 2 documents matching your query.

1. [TowerTalk] Hi Pot testing Effects.. (score: 1)
Author: "Pat Barthelow" <aa6eg@hotmail.com>
Date: Sun, 18 Sep 2005 14:25:10 -0700
Folks: Can/Does a properly designed HI-Pot tester test, permanently damage a HV capacitor if there is arc-over? i.e. when if the HI Pot punctures the dielectric, is the the resulting arc damage perma
/archives//html/Towertalk/2005-09/msg00579.html (7,714 bytes)

2. Re: [TowerTalk] Hi Pot testing Effects.. (score: 1)
Author: "Tom Rauch" <w8ji@contesting.com>
Date: Sun, 18 Sep 2005 19:04:28 -0400
permanently damage a HV It can if there is a dielectric punch through. It will make a pin hole in the dielectric even at very low current. the resulting arc Yes. Unless it is a fluid, air, or vacuum
/archives//html/Towertalk/2005-09/msg00583.html (8,437 bytes)


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