[Amps] MTBF Thread...

[sccook1@cox.net]

I have not been following this thread very closely, but did anyone bring up the aapproach whereby devices are subjected to added stress; e.g., high temperature "Burn In" aka "Accelerated Life Test" as part of a regime of establishing reliability for a device.

In the microelectronics world, they uses MIL-STD-883.  During the process of "Qualification" the device is subjected to a variety of tests and environments to demonstrate deisgn adaquacy.  "1000 Hour Life Test" is a common part of qualification and involves an extended burn-in for 1000 hours at 125 deg C (typical).  The hardware is tested every 250 hours or so.  

I believe there is some information in the literature that equates Life Test with MTBF... but I can't remember what it is.

There, I feel better now...

Steve (WG7K)