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[Amps] MTBF Thread...

To: <amps@contesting.com>
Subject: [Amps] MTBF Thread...
From: <sccook1@cox.net>
Date: Mon, 12 Sep 2005 18:16:12 -0400
List-post: <mailto:amps@contesting.com>
I have not been following this thread very closely, but did anyone bring up the 
aapproach whereby devices are subjected to added stress; e.g., high temperature 
"Burn In" aka "Accelerated Life Test" as part of a regime of establishing 
reliability for a device.

In the microelectronics world, they uses MIL-STD-883.  During the process of 
"Qualification" the device is subjected to a variety of tests and environments 
to demonstrate deisgn adaquacy.  "1000 Hour Life Test" is a common part of 
qualification and involves an extended burn-in for 1000 hours at 125 deg C 
(typical).  The hardware is tested every 250 hours or so.  

I believe there is some information in the literature that equates Life Test 
with MTBF... but I can't remember what it is.

There, I feel better now...

Steve (WG7K)

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