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Re: [Amps] LCR meter

To: amps@contesting.com
Subject: Re: [Amps] LCR meter
From: Larry Benko <xxw0qe@comcast.net>
Date: Tue, 30 Mar 2010 11:30:07 -0600
List-post: <amps@contesting.com">mailto:amps@contesting.com>
Here are some real numbers I just measured on a network analyzer 
calibrated at the plane of the core being measured.

Core = T94-2 powdered iron u=10, 22 turns #18 occupying about 80% of core

Msmt. freq.     L(measured)

50KHz           3.06uH
100KHz          3.86uH
200KHz          4.53uH
500KHz          4.51uH
1MHz            4.50uH
5MHz            4.50uH
10MHz           4.58uH
20MHz           4.89uH
30MHz           5.52uH
40MHz           6.80uH
68.1MHz         parallel resonant freq.

As can be seen frequencies above 10MHz show the beginning effects of the 
parallel resonance and low measurement frequencies underestimate the 
inductance by a significant amount.  Also mounting the inductor in a 
metal box will reduce the inductance. I suspect if the measurement freq. 
was 1KHz the values would be even lower.  I always measure near the 
frequency I intend to use the inductor at and if possible with the 
inductor mounted in the enclosure.  Then calibrating to the inductor 
plane gives the "real" inductance and filters and matching networks come 
out as predicted.

73,
Larry, W0QE




Vic K2VCO wrote:
> On 3/30/2010 4:47 AM, Jack/W6NF wrote:
>   
>> I have used an HP LCR meter at work but never paid any attention to the
>> frequency at which the measurement is made. I wonder what discrepancies in
>> measurement values of L and C could be encountered if one measured at
>> various RF frequencies, and why they might occur. I have seen such
>> discrepancies, using a popular antenna analyzer, even though I was careful
>> not to introduce sources of error, like lead lengths.
>>     
>
> If the coil has a ferrite or iron core of any kind, the inductance varies a 
> lot with 
> frequency. Inductors with cores must be measured near the operating 
> frequency. And in 
> general, as you raise the frequency the various stray capacitances and 
> inductances in the 
> device under test become more significant.
>   
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